Microscopy
Image
Make/Model
Bruker Nanoscope MultiMode IIIa (www.bruker.com)
Digital Instruments Multimode IIIa Atomic Force Microscope (AFM) can obtain 3D surface topography at nanometer scale resolution, to measure contact and friction forces between surfaces.
Modes of Operation:
- Contact (regular, lateral, and current imaging) mode imaging
- Tapping (regular, electric, and magnetic)
- Fluid cell
Available scanners:
- J-type, 125 um x 125 um, z 4.33 um
- E-type, 10 um x 10 um, z 1.6 um
Facility
Location
MRC243B