Metrology is crucial in a wide range of industries where precise measurements are essential for ensuring product quality, safety, and compliance with standards. Metrology research at Rensselaer aims to employ advanced techniques to understand materials structure and function relation at the atomic scale as well as develop new techniques for in-line measurements for manufacturing.
Material Properties
Researchers study the thermal, mechanical, magnetic and electrical transport properties of materials in controlled environments, such as magnetic fields and temperature. Detailed characterization of physical properties is essential for understanding the material’s structure, behavior, and potential applications.
Optoelectronic Measurements
Optoelectronics integrates the properties of optical and electronic materials and devices to facilitate the detection, generation, and manipulation of light. This field encompasses a broad spectrum of applications, including light-emitting diodes (LEDs), laser diodes, photodiodes, and solar cells.
Chemical & Structural Analysis
Advanced chemical and structural analysis techniques are instrumental in advancing our understanding of materials at the molecular and atomic levels. X-Ray scattering, IR and Raman Spectroscopy, X-Ray diffraction, X-Ray Photoelectron Spectroscopy, Reflection high- energy electron diffraction techniques.
Microscopy and Imaging
Advanced microscopy techniques covers a wide range of sophisticated methods and instruments used to visualize and analyze specimens at various scales, from the macroscopic to the nanoscale. THz imaging, super-resolution microscopy, transmission and scanning electron microscopy, atomic force microscopy and in-situ imaging techniques.
Faculty
- Ishwara Bhat, Electrical, Computer and Systems Engineering
- Theo Borca-Tasciuc, Mechanical, Aerospace and Nuclear Engineering
- Edwin Fohtung*, Materials Science and Engineering
- Daniel Gall, Materials Science and Engineering
- Mona Hella, Electrical, Computer and Systems Engineering
- Robert Hull, Materials Science and Engineering
- Chaitanya Ullal, Materials Science and Engineering
- Gwo-Ching Wang*, Physics
- Christian Wetzel, Physics
- Ingrid Wilke, Physics