Focused Ion Beam (FIB) microscopy: how FIB-SEM can help in your research. Lunch-and-Learn
Instructors: M. David Frey, Chao Yang, and Katharine Dovidenko
12-1 pm on Nov 8th, MRC 136
The Center for Materials Devices and Integrated Systems (CMDIS) would like to invite you for a Lunch-and-Learn on the Focused Ion Beam (FIB) microscopy and how FIB-SEM can help in your research. The Lunch-and-Learn will cover the basics of FIB-SEM with a strong focus on applications for materials and device research.
Lunch provided!
Registration is free and open to all RPI students, faculty, and staff, and is limited to the first 30 registrants (email Jennifer Tedesco, tedesco@rpi.edu, please) by November 2nd.
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Focused Ion Beam – Scanning Electron Microscopy (FIB-SEM) is an advanced technique for site-specific cross-sectioning of devices and materials to examine morphology, chemistry, and microstructure. FIB also has the ability to cross-section materials that are traditionally challenging to cross-section mechanically such as polymers and biological materials.
By combining FIB preparation with Transmission Electron Microscopy (TEM), Energy Dispersive X-Ray Spectrometry (EDS), Auger Electron Spectroscopy (AES), and Electron Backscatter Diffraction (EBSD), it is possible to examine aspects of your materials/devices that can provide significant insights and assistance in research. Furthermore, FIB can be used for nano-scale fabrication, creating specific patterns per imported bitmap files.
The Lunch-and-Learn will be followed by a next-day sign-up option for a free trial of your material/device/application using one of our two FIB-SEM systems on campus. It will also include a short demo of the FIB-SEM next door to the classroom. Do not miss this opportunity!
If you are interested, please register via email to Jennifer Tedesco, tedesco@rpi.edu, with the following information:
1. Your name & email
2. For students:
- Please, tell us if undergraduate or graduate
- Add a couple of words on your materials/device research area