The Nanoscale Characterization Core at the Center for Materials, Devices and Integrated Systems (CMDIS) would like to invite you to a short course on Transmission Electron Microscopy (TEM) on May 27th (Wednesday) and May 28th (Thursday) between 9:00am-1:30pm via Webex.
Transmission Electron Microscopy (TEM) is an imaging/analytical technique for nano-scale crystallographic, morphological, and compositional characterization of materials, including biological and two-dimensional structures, and electronic devices. We invite you to learn more about TEM and how it can help in your research.
Course instructor: Katharine Dovidenko, RPI
Invited speakers:
Dustin J. Andersen, RPI
Frieder H. Baumann, Global Foundries
Brent J. Engler, RPI
Robert Hull, RPI
Khim Karki, Hummingbird Scientific
Alexander Kvit, U. Wisconsin-Madison
Ben Miller, Gatan, Inc.
Live TEM demonstration by Kevin McIlwrath, JEOL-USA, remote access to JEM-1400Flash is graciously provided by San Joaquin Delta College, Stockton, CA.
Course description:
This short course will provide a comprehensive introduction to Transmission Electron Microscopy in materials science and will consist of two consecutive half-days, May 27th and 28th. Each day will start with lectures on TEM fundamentals, with day 1 covering basics of electron optics and the contrast mechanisms, and day 2 continuing with phase contrast, diffraction, and Scanning TEM. These lectures will be followed by the special topics sessions covering the in-situ microscopy, TEM applications for different materials, and select advanced methods such as electron tomography and Electron Energy Loss Spectroscopy. The special topics will be covered by invited speakers from academia and industry.
The short course is aimed at an audience with a wide range of technical backgrounds, and no TEM experience is required.
If you are interested in learning more about TEM techniques, please register online at <https://webforms.rpi.edu/transmission-electron-microscopy-short-course> and join us on May 27thand 28th. Registration is free and open to all RPI students, faculty, and staff.
Program:
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May 27 |
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Time |
Topic |
Instructor/Presenter |
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SESSION I GENERAL TEM lectures |
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9 – 9:20 am |
Introduction. |
Katharine Dovidenko, RPI |
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9:20 – 10 am |
TEM instrumentation, Jeol 2011, new TEMs. |
Katharine Dovidenko, RPI |
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10– 10:45 am |
Contrast mechanisms in TEM: |
Katharine Dovidenko, RPI |
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SESSION II SPECIAL TOPICS in TEM |
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10:45 – 11:15 |
TEM and SEM: Using Complimentary Analysis Techniques |
Dustin J. Andersen |
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11:15– 11:35 |
Benchtop to in-Situ - Some Challenges in Experimental Design |
Brent J. Engler, RPI |
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11:35 – 12 pm |
break |
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12 – 12:20 pm |
In-situ and operando TEM tools for interdisciplinary research |
Khim Karki, Hummingbird Scientific |
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12:20 – 12:50 |
Challenges in Characterization of Point Defect by HAADF- and LAADF- STEM Images |
Alex Kvit, U. Wisconsin-Madison |
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12:50 – 1:30 pm |
Live TEM demo |
Kevin McIlwrath, Jeol, remote TEM access courtesy of San Joaquin Delta College, CA |
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May 28 |
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Time |
Topic |
Instructor/Presenter |
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SESSION I GENERAL TEM lectures |
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9 – 9:45 am |
Contrast mechanisms (continued): |
Katharine Dovidenko, RPI |
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9:45–10:10 am |
Diffraction topics (SADP, CBED) |
Katharine Dovidenko, RPI |
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10:10 -10:30am |
Example of techniques application: |
Katharine Dovidenko, RPI |
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SESSION II SPECIAL TOPICS in TEM |
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10:30 – 11 am |
Aberration Corrected TEM |
Dustin J. Andersen, RPI |
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11 – 11:30 am |
Application examples from the physical sciences |
Robert Hull, RPI |
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11:30 – 12 pm |
break |
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12 – 12:30 |
EELS and more |
Ben Miller, Gatan, Inc. |
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12:30 – 1 pm |
Recent advances in VLSI characterization using the TEM |
Frieder H. Baumann, Global Foundries |
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1pm |
Questions and Answers, Wrap-up |
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