Nanoscale Characterization Core (NCC) at the Center for Materials, Devices and Integrated Systems (CMDIS) would like to invite you to a short course on Scanning Electron Microscopy (SEM) on January.11-14.2021 between 9:00am-1:10pm via Webex.
We invite you to learn both theoretical and practical aspects of Scanning Electron Microscopy, a method of materials and structure evaluation. The short course aims to deepen current users understanding of the SEM techniques and help potential new users to develop theoretical understanding which will allow quicker mastering of practical microscopy. The course is aimed at an audience with a wide range of technical backgrounds, and no prior SEM experience is required.
Course Instructors: Dr. Katharine Dovidenko, Ray Dove, David Frey (RPI)
Guest Instructor: Prof. Eric Lifshin (SUNY POLY)
Guest Speaker: Dr. Dustin Andersen (RPI)
Daily schedule:
9:00am - 11:10 am Lectures
11:20am - 1:00 pm Live webex SEM demonstrations of the lecture materials
Technical Agenda:
Jan 11 - Monday
Basics of electron source and optics; Microscope overview; Detectors Beam-material interactions
Jan 12 - Tuesday
Basics of imaging in SEM
Jan 13 - Wednesday
Advanced considerations in SEM imaging
Specific materials challenges (polymers, nano)
Jan 14 - Thursday
Sample preparation for SEM
Expert Round table, questions and answers
Please contact Katharine Dovidenko (dovidk2@rpi.edu) for questions.